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1.
Defext - oriented Testing for Nano-Matric CMOS VLSI Circuits by
Edition: 2nd
Material type: Text Text
Language: ENGLISH
Publication details: Springer International Ed 2010
Availability: Items available for loan: CENTRAL LIBRARY, NOORUL ISLAM CENTRE FOR HIGHER EDUCATION (1)Location, call number: Nanotechnology 621.395 Q0.

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2.
Integrated Circuit Manufacturing : The Art of Process and Design Integration by
Edition: 1st
Material type: Text Text
Language: ENGLISH
Publication details: IEEE 1999
Availability: Items available for reference: CENTRAL LIBRARY, NOORUL ISLAM CENTRE FOR HIGHER EDUCATION: Not for loan (1)Location, call number: Electronics 621.3815 N9.

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3.
Integrated Circuit Manufacturability by
Edition: 1st
Material type: Text Text
Language: ENGLISH
Publication details: IEEE 1999
Availability: Items available for reference: CENTRAL LIBRARY, NOORUL ISLAM CENTRE FOR HIGHER EDUCATION: Not for loan (1)Location, call number: Mechanical 621.3815 N9.

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